Vacuum FTIR
Bruker Vertex 80 and Hyperion 2000 microscope

About the Instrument The coupled Bruker VERTEX 80/80v spectrometer and HYPERION 2000 microscope form a high-end, research-grade Micro-FT-IR system. It allows for non-destructive, micro-scale chemical analysis and mapping across transmission, reflection, and Attenuated Total Reflection (ATR) modes.
Measurements & Analysis - Chemical Mapping: The Hyperion 2000 can scan a sample surface and create a "heat map" showing the distribution of specific chemical functional groups.
- Modes of Analysis: Measures in Transmission (requires very thin, flat samples), Reflection (for coatings on reflective/metallic surfaces), and ATR. The system also utilizes grazing angle objectives (GAO) for ultra-thin films.
- Functional Group Identification: The collected spectra act as "chemical fingerprints."
- Multivariate Analysis: For complex mixtures or mapping datasets, Principal Component Analysis (PCA) or Cluster Analysis is often used to group regions of the sample with similar spectral signatures without manually evaluating thousands of individual spectra.
Applications - Materials & Polymer Science
- Pharmaceuticals
- Forensics & Art
- Conservation
- Life Sciences & Biology
- Semiconductor & Electronics
 
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