Atomic Force Microscope (AFM)
SPM SmartSPM™-1000
About the Instrument The Atomic Force Microscope (AFM) is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality.Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques).
Measurements & Analysis 1. Primary Imaging Modes Topographical Modes- Contact AFM
- Semicontact (Tapping Mode)
- Non-contact AFM
Mechanical Modes- Phase Imaging
- Lateral Force Microscopy (LFM)
- Force Modulation
- Force Spectroscopy
2. Advanced Analytical Capabilities (Functional Imaging)
Electrical Measurements - Kelvin Probe Force Microscopy (KPFM)
- Conductive AFM (C-AFM)
- Electric Force Microscopy (EFM) & Scanning
- Capacitance Microscopy (SCM)
Magnetic Measurements- Magnetic Force Microscopy (MFM)
Electromechanical Response- Piezoresponse Force Microscopy (PFM)
Applications - Materials Science & Metallurgy: Measures surface roughness, grain size, and topography at atomic resolution.
- Electronics & Semiconductors: Maps electrical and magnetic surface properties using Electric Force Microscopy (EFM) and Kelvin Probe.
- Optics & Photonics: Integrates with spectrometers (Raman, SNOM) for chemical imaging at the nanoscale.
- Biology & Chemistry: Studies living cells and liquids using specialized liquid and electrochemical cells.
- Nanotechnology: Performs nanolithography to physically carve or manipulate nanoscale patterns on a surface
  
  
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