Keithley 4200A-SCS

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About the Instrument

The Keithley 4200A-SCS Parameter Analyzer is a modular, high-performance, and fully integrated characterization system used for semiconductor device, material, and process development. It provides synchronized DC (I-V), Capacitance-Voltage (C-V), and ultra-fast pulsed I-V measurements in a single box, reducing test setup time by up to 50%.

Measurements & Analysis

• ​DC I-V Characterization: Offers modules with ± 210V / 100 mA or ±210V / 1A range, featuring 100fA resolution, or down to 10aA}\) with optional preamps.
• Capacitance-Voltage (C-V): Covers 1 kHz – 10 MHz frequency range with ±30V DC bias (expandable to ±210V) for AC impedance measurements.
• Ultra-fast Pulsed I-V: PMU modules offer 200MSa/s with 5ns sampling rates, ±40V (80V_p-p ), and ±800 mA.
• 4200-PA Remote Preamp: Provides 10aA current resolution, essential for low-current measurements like FET gate leakage.
• Switching: The 4200-CVIV Multi-Switch enables automated switching between I-V and C-V measurements without re-cabling
  

Applications

•  Semiconductor Device Characterization: MOSFET/BJT Testing , Non-Volatile Memory (NVM) , BioFETs & Sensors.
• Materials Research: Resistivity & Mobility, Nano-electronic Devices.
• Process & Reliability Engineering : Wafer-Level Reliability (WLR) , Mobile Ion Concentration.
• Advanced Pulsed & Frequency Analysis : Pulsed I-V Characterization, Noise and Impedance Analysis.